Project Leader in Nanoscale Imaging Group/ Nanoscale Device Characterization Division at NIST
Andrei’s current research interests are in the developing of the methodology and instrumentation for in situ electron (and X-ray) imaging and spectroscopic characterization of nanodevices and working interfaces in operando mode under realistic environments, including liquid, dense gaseous and plasma media.
Visit website: https://www.nist.gov/people/andrei-kolmakov
See also: National Institute of Standards and Technology (NIST) - One of the USA's oldest physical science laboratories - now part of the U.S. Department of Commerce
Andrei Kolmakov News
X-ray beams enable ultra small 3D printed structures
Phys.org - 22-Sep-2020
Fine structure suitable for tissue engineering and other medical applicationsRead more...